Gij and Oij are classified as the acquire coefficient and bias coefficient obtained right after two-position correction respectively, as well as expressions of bias coefficient Gij and obtain coefficient Oij are shown in Equation (5). NIST is developing the metrology to determine aim exam and analysis protocols for these imagers https://dantenbnak.theideasblog.com/29157606/the-definitive-guide-to-ir-thermal-imaging